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Scanning Probe Microscopy and Spectroscopy

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Publication date

2014

Authors

Liljeroth, P.ISNI 0000000392164565
Grandidier, B.
Delerue, ChristopheISNI 0000000114693352
Vanmaekelbergh, DanielISNI 0000000394482321

Editors

Mello Donegá , Celso de

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DOI

https://doi.org/10.1007/978-3-662-44823-6_8

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Part of book

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Abstract

This chapter shows how scanning tunneling microscopy and spectroscopy and atomic force microscopy can be used to measure the properties of individual nanocrystals, thereby circumventing the limitations of ensemble based measurements.

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Citation

Liljeroth, P, Grandidier, B, Delerue, C & Vanmaekelbergh, D 2014, Scanning Probe Microscopy and Spectroscopy. in C D Mello Donegá (ed.), Nanoparticles : Workhorses of Nanoscience. Springer, pp. 223-255. https://doi.org/10.1007/978-3-662-44823-6_8

URI

https://dspace.library.uu.nl/handle/1874/307993