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Atomic imaging of phase transitions and morphology transformations in nanocrystals

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2009

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van Huis, M.
Young, N.P.
Pandraud, G.
Creemer, J.F.
Vanmaekelbergh, DanielISNI 0000000394482321
Kirkland, A.I.
Zandbergen, H.W.

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Abstract

A newly developed SiN microhotplate allows specimens to be studied at temperatures up to 1000 K at a resolution of 100 picometer (see image). Aberration-corrected transmission electron microscopy has become a commonplace tool to investigate stable crystals; however, imaging transient nanocrystals is much more demanding. Morphological transformations in gold nanoparticles and layer-by-layer sublimation of PbSe nanocrystals is imaged with atomic resolution.

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van Huis, M, Young, N P, Pandraud, G, Creemer, J F, Vanmaekelbergh, D A M, Kirkland, A I & Zandbergen, H W 2009, 'Atomic imaging of phase transitions and morphology transformations in nanocrystals', Advanced Materials, vol. 21, no. 48, pp. 4992-4995.

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https://dspace.library.uu.nl/handle/1874/40601