Time-lapse misorientation maps for the analysis of electron backscatter diffraction data from evolving microstructures

Abstract

A “time-lapse misorientation map” is defined here as a map which shows the orientation change at each point in an evolving crystalline microstructure between two different times. Electron backscatter diffraction data from in situ heating experiments can be used to produce such maps, which then highlight areas of microstructural change and also yield statistics indicative of how far different types of boundary (with different misorientations) have moved.