Critical EPR line broadening in the double-layer antiferromagnet K3Mn2F7
Publication date
1980
Authors
Uijen, C.M.J.
Wijn, H.W. de
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Document Type
Article
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Abstract
The divergence of the EPR linewidth of Mn2+ in K3Mn2F7 when approaching TN = 58.3 K has been measured at 25 GHz for magnetic fields parallel and perpendicular to the easy axis. The critical exponent p is in accord with the relation p = (3 - 2η)v for critical coefficients of 2D systems.