Mapping Elevated Temperatures with a Micrometer Resolution Using the Luminescence of Chemically Stable Upconversion Nanoparticles

Publication date

2021-04-23

Authors

van Swieten, Thomas P.ISNI 0000000492798266
Van Omme, Tijn
van den Heuvel, D.J.ISNI 0000000419512946
Vonk, Sander J.W.ISNI 0000000492798311
Spruit, Ronald G.
Meirer, FlorianISNI 0000000137317800
Garza, H. Hugo Pérez
Weckhuysen, Bert M.ORCID 0000-0001-5245-1426ISNI 0000000110540180
Meijerink, AndriesISNI 000000039216731X
Rabouw, Freddy T.ISNI 0000000492491619

Editors

Advisors

Supervisors

Document Type

Article
Open Access logo

License

cc_by_nc_nd

Abstract

The temperature-sensitive luminescence of nanoparticles enables their application as remote thermometers. The size of these nanothermometers makes them ideal to map temperatures with a high spatial resolution. However, high spatial resolution mapping of temperatures >373 K has remained challenging. Here, we realize nanothermometry with high spatial resolutions at elevated temperatures using chemically stable upconversion nanoparticles and confocal microscopy. We test this method on a microelectromechanical heater and study the temperature homogeneity. Our experiments reveal distortions in the luminescence spectra that are intrinsic to high-resolution measurements of samples with nanoscale photonic inhomogeneities. In particular, the spectra are affected by the high-power excitation as well as by scattering and reflection of the emitted light. The latter effect has an increasing impact at elevated temperatures. We present a procedure to correct these distortions. As a result, we extend the range of high-resolution nanothermometry beyond 500 K with a precision of 1-4 K. This work will improve the accuracy of nanothermometry not only in micro- and nanoelectronics but also in other fields with photonically inhomogeneous substrates.

Keywords

luminescence, microscopy, nanothermometry, photonics, spectral artifacts, temperature mapping, General Materials Science

Citation

Van Swieten, T P, Van Omme, T, Van Den Heuvel, D J, Vonk, S J W, Spruit, R G, Meirer, F, Garza, H H P, Weckhuysen, B M, Meijerink, A, Rabouw, F T & Geitenbeek, R G 2021, 'Mapping Elevated Temperatures with a Micrometer Resolution Using the Luminescence of Chemically Stable Upconversion Nanoparticles', ACS Applied Nano Materials, vol. 4, no. 4, pp. 4208-4215. https://doi.org/10.1021/acsanm.1c00657