Scanning Transmission X-Ray Microscopy as a Novel Tool to Probe Colloidal and Photonic Crystals

Publication date

2011-03-21

Authors

van Schooneveld, MattiISNI 0000000391069443
Hilhorst, J.ISNI 0000000392862427
Petukhov, A. V.ORCID 0000-0001-9840-6014ISNI 0000000389991404
Tyliszczak, Tolek
Wang, Jian
Weckhuysen, BertORCID 0000-0001-5245-1426ISNI 0000000110540180
de Groot, FrankISNI 0000000114483312
de Smit, Emiel

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Article
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Abstract

Photonic crystals consisting of nano-to micrometer-sized building blocks, such as multiple sorts of colloids, have recently received widespread attention. It remains a challenge, however, to adequately probe the internal crystal structure and the corresponding deformations that inhibit the proper functioning of such materials. It is shown that scanning transmission X-ray microscopy (STXM) can directly reveal the local structure, orientations, and even deformations in polystyrene and silica colloidal crystals with 30-nm spatial resolution. Moreover, STXM is capable of imaging a diverse range of crystals, including those that are dry and inverted, and provides novel insights complementary to information obtained by benchmark confocal fluorescence and scanning electron microscopy techniques.

Keywords

ADVANCED LIGHT-SOURCE, ABSORPTION SPECTROSCOPY, CATALYTIC SOLIDS, STACKING-FAULTS, RESOLUTION, SPHERES, SPECTROMICROSCOPY, DIFFRACTION, THICKNESS, EMISSION, Taverne

Citation

van Schooneveld, M M, Hilhorst, J, Petukhov, A V, Tyliszczak, T, Wang, J, Weckhuysen, B M, de Groot, F M F & de Smit, E 2011, 'Scanning Transmission X-Ray Microscopy as a Novel Tool to Probe Colloidal and Photonic Crystals', Small: nano micro, vol. 7, no. 6, pp. 804-811. https://doi.org/10.1002/smll.201001745