Direct laser patterning of ruthenium below the optical diffraction limit

Publication date

2024-04-22

Authors

Cruciani, Lorenzo
Vreugdenhil, MarnixISNI 0000000507780131
van Vliet, Stefan
Abram, Ester
Van Oosten, D.ISNI 0000000396709315
Bliem, Roland
van Druten, Klaasjan
Planken, Paul

Editors

Advisors

Supervisors

Document Type

Article
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License

cc_by

Abstract

We describe a method that can be used to produce ruthenium/ruthenium oxide patterns starting from a ruthenium thin film. The method is based on highly localized oxidation of a small surface area of a ruthenium film by means of exposure to a pulsed laser under ambient conditions. Laser exposure is followed by dissolution of the un-exposed ruthenium in a NaClO solution, which leaves the conductive, partially oxidized ruthenium area on the substrate. Spatially selective oxidation, material removal, and, by implication, patterning, are, therefore, achieved without the need for a photoresist layer. Varying the exposure laser parameters, such as fluence, focus diameter, and repetition rate, allows us to optimize the process. In particular, it enables us to obtain circular Ru/RuO2 islands with a sub-diffraction-limited diameter of about 500 nm, for laser exposure times as short as 50 ms. The capability to obtain such small islands suggests that heat-diffusion is not a limiting factor to pattern Ru by laser heating on a (sub-)micron scale. In fact, heat diffusion helps in that it limits the area where a sufficiently high temperature is reached and maintained for a sufficiently long time for oxidation to occur. Our method provides an easy way to produce metallic Ru/RuO2 (sub-)micron structures and has possible applications in semiconductor manufacturing.

Keywords

Physics and Astronomy (miscellaneous)

Citation

Cruciani, L, Vreugdenhil, M, van Vliet, S, Abram, E, van Oosten, D, Bliem, R, van Druten, K & Planken, P 2024, 'Direct laser patterning of ruthenium below the optical diffraction limit', Applied Physics Letters, vol. 124, no. 17, 171902. https://doi.org/10.1063/5.0205538