Whetting the SWORD: Detecting Workarounds by Using Active Learning and Logistic Regression

Publication date

2024-01-03

Authors

Waal, Wouter van derORCID 0000-0001-6514-7570ISNI 0000000512641726
Van De Weerd, IngeORCID 0000-0003-3420-6923ISNI 0000000387888163
Haitjema, Saskia
Kappen, Teus
Reijers, Hajo A.ORCID 0000-0001-9634-5852ISNI 0000000037238136

Editors

Bui, Tung X.

Advisors

Supervisors

Document Type

Part of book
Open Access logo

License

cc_by_nc_nd

Abstract

In many organizations, especially in healthcare, workers may work around prescribed procedures. Detecting these workarounds can give insights into difficulties concerning the procedures, which in turn can be used to improve them. Previous studies have shown that workarounds may be discovered from an event log using a set of predefined patterns such as the duration of a trace or the number of resources involved in one. However, domain experts may find it difficult to evaluate and monitor results if there are multiple patterns that indicate workarounds. Training a model that merges the features is often difficult because there are no available datasets covering workarounds. Labeling traces generally requires a lot of time from domain experts. In addition, this would have to be repeated for every new domain, company, or even department since the types of workarounds that occur may differ strongly between them. In this work, we propose to combine the features using a Logistic Regression model and train through Active Learning. In a case study at a hospital, we find that after training the model on only 10 to 15 traces, it stabilizes with an approximate F1 score of .75. This shows that we create and train a model that can detect workarounds well without requiring a large amount of labeled data or a lot of time from a domain expert.

Keywords

Active Learning, Event log, Logistic Regression, Process Mining, Workarounds

Citation

van der Waal, W, van de Weerd, I, Haitjema, S, Kappen, T & Reijers, H 2024, Whetting the SWORD : Detecting Workarounds by Using Active Learning and Logistic Regression. in T X Bui (ed.), Proceedings of the 57th Annual Hawaii International Conference on System Sciences, HICSS 2024. Proceedings of the Annual Hawaii International Conference on System Sciences, IEEE, pp. 3687 - 3696, 57th Hawaii International Conference on System Sciences, Honolulu, United States, 3/01/24. https://doi.org/10125/106828, conference