Atomic XAFS as a Tool to Probe the Electronic Properties of Supported Noble Metal Nanoclusters
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2005
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International
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van der Eerden, A M J, Visser, M H, Nijhuis, T A, Ikeda, Y, Lepage, M & Koningsberger, D C 2005, 'Atomic XAFS as a Tool to Probe the Electronic Properties of Supported Noble Metal Nanoclusters', Journal of the American Chemical Society, vol. 127, pp. 3272-3273.