Atomic XAFS as a Tool to Probe the Electronic Properties of Supported Noble Metal Nanoclusters

Publication date

2005

Authors

van der Eerden, A.M.J.ISNI 0000000397157444
Visser, M.H.
Nijhuis, T.A.
Ikeda, Y.
Lepage, M.
Koningsberger, D.C.ISNI 0000000116485020

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Advisors

Supervisors

DOI

Document Type

Article
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Abstract

Keywords

International

Citation

van der Eerden, A M J, Visser, M H, Nijhuis, T A, Ikeda, Y, Lepage, M & Koningsberger, D C 2005, 'Atomic XAFS as a Tool to Probe the Electronic Properties of Supported Noble Metal Nanoclusters', Journal of the American Chemical Society, vol. 127, pp. 3272-3273.