In situ hard X-ray microscopy of self-assembly in colloidal suspensions

Publication date

2013

Authors

Byelov, D.
Meijer, J.M.ISNI 0000000449400232
Snigireva, I.
Snigirev, A.
Rossi, L.ISNI 0000000419438950
van den Pol, EISNI 0000000397048117
Kuijk, A.ISNI 0000000394292907
Philipse, AlbertISNI 000000038745113X
Imhof, ArnoutISNI 0000000369252655
van Blaaderen, AlfonsISNI 0000000388251965

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Abstract

An experimental setup combining full-field transmission X-ray microscopy (TXM) and microradian X-ray diffraction (mradXRD) is tested for the in situ study of self-organization of colloidal dispersions of anisotropic particles. Averaged structural information of the samples is determined by mradXRD and local morphology is determined by TXM. Utilization of hard X-rays (12.2 keV) and the ease of switching from diffraction mode to microscopy mode makes such a setup a unique tool, especially for the study of opaque colloidal systems. We demonstrate diffraction patterns together with real space images of the following morphologies: smectic structures in the sediment of colloidal silica rods, the reorientation of a smectic phase of goethite particles in an elevated magnetic field and an interface region between isotropic and ordered phases in a dispersion of colloidal hematite cubes.

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Byelov, D, Meijer, J M, Snigireva, I, Snigirev, A, Rossi, L, van den Pol, E, Kuijk, A, Philipse, A P, Imhof, A, van Blaaderen, A, Vroege, G J & Petukhov, A V 2013, 'In situ hard X-ray microscopy of self-assembly in colloidal suspensions', RSC Advances, vol. 3, pp. 15670-15677. https://doi.org/10.1039/c3ra41223g