Quantifying elemental colocation in nanostructured materials using energy-dispersive X-ray spectroscopy

Publication date

2025-05

Authors

Helfferich, Kristiaan HansISNI 0000000506610632
Meeldijk, Johannes D.ISNI 0000000419468594
van Huis, M.A.ISNI 0000000388374666
van der Hoeven, JessiISNI 0000000493299290
de Jongh, P.E.ISNI 0000000395610073

Editors

Advisors

Supervisors

Document Type

Article
Open Access logo

License

cc_by

Abstract

Multicomponent nanostructured materials are key amongst others for energy and catalysis applications. The nanoscale proximity of different metals critically determines the performance of these functional materials. However, it is difficult to study the spatial distribution of different elements at the nanoscale, especially achieving a statistically relevant assessment. Additionally, common support materials like metal oxides are sensitive to electron beam damage when using high resolution local techniques, such as transmission electron microscopy. We present a robust strategy to quantitatively assess elemental distributions in 3D nanostructured beam-sensitive samples. Key elements are resin embedding, and elemental co-localisation building on a combination of electron tomography and energy-dispersive X-ray spectroscopy. We showcase the methodology with ∼ 3 nm Pd-Ni nanoparticles supported on mesoporous silica. Epoxy resin-embedding ensured sufficient sample stability under the electron beam for tomography-based quantification of different mano- and mesoscale elemental distributions in these samples. Reliable co-location results were obtained and practical guidelines are provided for acquisition and post-processing, relevant for elemental overlap analysis in multi-metallic samples.

Keywords

Bimetallic catalysts, Colocation analysis, EDX spectroscopy, Pd-Ni, Electronic, Optical and Magnetic Materials, Atomic and Molecular Physics, and Optics, Instrumentation

Citation

Helfferich, K H, Meeldijk, J D, van Huis, M A, van der Hoeven, J E S & de Jongh, P E 2025, 'Quantifying elemental colocation in nanostructured materials using energy-dispersive X-ray spectroscopy', Ultramicroscopy, vol. 271, 114123. https://doi.org/10.1016/j.ultramic.2025.114123