Submolecular Resolution Imaging of molecules by Atomic Force Microscopy:The influence of the Electrostatic Force

Publication date

2016

Authors

Van Der Lit, JoostISNI 0000000419520778
Cicco, F.
Hapala, P.
Jelinek, P.
Swart, IngmarORCID 0000-0003-3201-7301ISNI 0000000390199991

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Article
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Abstract

The forces governing the contrast in submolecular resolution imaging of molecules with atomic force microscopy (AFM) have recently become a topic of intense debate. Here, we show that the electrostatic force is essential to understand the contrast in atomically resolved AFM images of polar molecules. Specifically, we image strongly polarized molecules with negatively and positively charged tips. A contrast inversion is observed above the polar groups. By taking into account the electrostatic forces between tip and molecule, the observed contrast differences can be reproduced using a molecular mechanics model. In addition, we analyze the height dependence of the various force components contributing to the high-resolution AFM contrast.

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Citation

van der Lit, J, Cicco, F, Hapala, P, Jelinek, P & Swart, I 2016, 'Submolecular Resolution Imaging of molecules by Atomic Force Microscopy:The influence of the Electrostatic Force', Physical Review Letters, vol. 116, 096102. https://doi.org/10.1103/PhysRevLett.116.096102