Pitfalls and prospects of optical spectroscopy to characterize perovskite-transport layer interfaces

Publication date

2020-03-09

Authors

Hutter, ElineORCID 0000-0002-5537-6545ISNI 0000000492896229
Kirchartz, Thomas
Ehrler, Bruno
Cahen, David
Von Hauff, Elizabeth

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Supervisors

Document Type

Article

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Abstract

Perovskite photovoltaics has witnessed an unprecedented increase in power conversion efficiency over the last decade. The choice of transport layers, through which photo-generated electrons and holes are transported to electrodes, is a crucial factor for further improving both the device performance and stability. In this perspective, we critically examine the application of optical spectroscopy to characterize the quality of the transport layer-perovskite interface. We highlight the power of complementary studies that use both continuous wave and time-resolved photoluminescence to understand non-radiative losses and additional transient spectroscopies for characterizing the potential for loss-less carrier extraction at the solar cell interfaces. Based on this discussion, we make recommendations on how to extrapolate results from optical measurements to assess the quality of a transport layer and its impact on solar cell efficiency.

Keywords

Physics and Astronomy (miscellaneous)

Citation

Hutter, E M, Kirchartz, T, Ehrler, B, Cahen, D & Von Hauff, E 2020, 'Pitfalls and prospects of optical spectroscopy to characterize perovskite-transport layer interfaces', Applied Physics Letters, vol. 116, no. 10, 100501. https://doi.org/10.1063/1.5143121